Our Topography, Profilometry, and Nanoindentation Suite provides precise tools for surface analysis and mechanical testing. Get accurate measurements of surface features and material properties to support your research needs.
Available Equipment
Horiba Scientific GD Profiler 2
Capabilities:
- Ultra-fast elemental depth profiling of conductive, non-conductive, and heat-sensitive specimens
- Glow discharge source sputters representative areas layer-by-layer
- High-resolution, high-sensitivity emission spectrometer to measure all elements of interest as a function of depth in real-time
- Low vacuum required, simplifying operation
- Can measure all elements from hydrogen to uranium with ppm sensitivity
- Nanometer or even sub-nanometer depth resolution for depth profiling
- Can perform depth profiling from the first nanometer down to ~150 μm deep into the materials
- Extremely fast, only takes minutes to collect the data down to ~100-150 μm deep into the materials
Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service
Hysitron TI 980 Nanoindenter
Capabilities:
- Dual piezo scanners deliver high-resolution sample surface topography imaging and nanometer precision test placement
- XPM ultrahigh-speed nanoindentation delivers high-resolution, quantitative mechanical property maps
- nanoDMA® III enables viscoelastic characterization and continuous measurement of properties as a function of depth, frequency, and time
- DMA II module with CMX algorithm provides a quantitative and truly continuous measurement of mechanical properties — including hardness, storage modulus, loss modulus, complex modulus, and tan delta — as a function of indentation depth, frequency, and time.
Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service
Asylum Research MFP-3D Origin AFM
Capabilities:
- Scanner ranges from atomic resolution to 120-micrometer x-y scan range and 15-micrometer z range
- Samples up to 80mm diameter and 15mm height
- Full complement of operating modes for fluid and air operation, including Contact/LFM, AC mode/tapping mode with phase and Q-control, electric force microscopy, surface potential microscopy, magnetic force microscopy, piezoresponse microscopy, Dual AC and Dual AC Resonance Tracking (DART), loss tangent imaging, force spectroscopy and force mapping, nanolithography, nanomanipulation
Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service
Nanoscope III Scanning Probe Microscopy (AFM)
Capabilities:
- The Digital Instruments Nanoscope IIIA is a multimode scanning probe microscope capable of performing scanning tunneling microscopy, atomic force microscopy (tapping and contact mode), and magnetic force microscopy
Hirox KH 8700 Digital Optical Microscope
Capabilities:
- 2.11 Mega-pixel CCD sensor, 24-frame video at 1600 x 1200 pixels
- High-intensity LED light source, 5700 K color temperature
- Motorized z-axis with 50 nm step resolution
- 2D measurement functions: distance, angle, radius, diameter, etc.
- 3D measurement functions including surface roughness
- MXG-2500REZ objective (35x to 2500x) and MXG-10C objective (up to 7000x)
General Inquiries
If you have a question about our equipment capabilities or want to know more about what’s available, let us know!
Senior Research Specialists
Dr. Eric Bohannan
bohannan@mst.edu
Hirox KH 8700
Phone: (573) 341-4534
G-6 Straumanis-James Hall
James Claypool
jbcgyf@mst.edu
AFM/Profiler/Nanoindenter
Phone: (573) 341-4358
225 Straumanis-James Hall