Explore our comprehensive suites of advanced research tools, designed to support a wide range of material analysis and characterization needs.
Electron Microscopy Suite
Advanced scanning and transmission electron microscopy and microprobe analysis tools for detailed material characterization.
X-ray Imaging, Diffraction, and Spectroscopy Suite
High-resolution X-ray imaging and analysis for materials’ structure, composition, surface, and internal features.
Profiling, Nanoindentation, and Thermal Analyses Suite
Surface analysis and nano-mechanical testing tools for precise topography, depth-resolved profiling, and nanoindentation measurements.