Electron Microscopy Suite

Utilize the Electron Microscopy Suite for precise imaging and material analysis. Our equipment is available to support your research needs with reliable, advanced tools for detailed characterization.

Available Equipment

Thermo Scientific Helios 5 Hydra CX DualBeam Focused Ion Beam/SEM

Capabilities:

  • Ultra-high-resolution imaging and topographical information
  • Elemental/phase contrast imaging
  • Quantitative/Qualitative compositional elemental data and element mapping
  • Gallium-free sample preparation
  • 3D reconstruction and serial sectioning

Location: B18 McNutt Hall

Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service | User-Assistance Form

Thermo Scientific Prisma E Variable Pressure SEM

Capabilities:

  • Enables imaging at low kV and low vacuum from nano to microscale
  • Can image wet, outgassing, or dirty materials
  • Enables Defect analysis, particle size, topography
  • Elemental/phase contrast analyses
  • Quantitative/Qualitative compositional analyses (point and line scanning)
  • Gaseous secondary electron detector for environmental SEM operation
  • Chemical analysis by EDS and WDS, texture analysis by EBSD

Location: B18 McNutt Hall

Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service | User-Assistance Form

Helios Nanolab 600 Dual Beam FIB/SEM/

Capabilities:

  • FEI Helios NanoLab 600 FIB/FESEM is intended for simultaneous site-specific FIB cross-sectioning and high-resolution non-destructive SEM imaging.
  • It is equipped with a STEM detector for STEM imaging and an Omniprobe (AutoProbe 200.2) nanomanipulator for high-accuracy nanomanipulation.
  • The instrument is capable of nanoscale Platinum deposition, patterning, lithography, and TEM cross-section specimen preparation.
  • It is equipped with an Oxford Energy Dispersive Spectrometer (EDS) and an HKL Electron Backscatter Diffraction (EBSD) system for composition and orientation analyses.

Location: B18 McNutt Hall

Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service | User-Assistance Form

Raith e-Line Plus: E-Beam Lithography and SEM/EDS

Capabilities:

  • The RAITH 150 E-beam Lithography System provides the capability for ultra-high resolution patterning.
  • The specimen chamber will handle substrates up to 200 mm.
  • Sophisticated internal systems provide height sensing and substrate leveling to keep the sample in focus even over these large travel ranges.
  • A unique cross-over-free beam path gives extremely high beam current density and exceedingly low aberrations. This results in top-quality lithographic performance.
  • The RAITH is capable of 20 nm minimum resolution, a field-to-field stitching accuracy of 40 nm, and an overlay accuracy of 40 nm.

Location: B18 McNutt Hall

Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service | User-Assistance Form

FEI Tecnai F-20 S-Twin TEM instrument

Capabilities:

  • FEI Tecnai F20 is a 200kV field emission gun (FEG) high-resolution TEM/STEM which was installed in 2010.
  • The microscope has a SuperTwin objective lens with a Cs of 1.2 mm.
  • With its 200 kV acceleration voltage and Schottky field emission source, this instrument provides outstanding stability, ease of use, and high-resolution performance in TEM/STEM imaging and micro-analysis.
  • The scope is equipped with an Oxford ultra-thin window EDX detector, a Gatan ORIUS wide-angle CCD, a Gatan ultra-scan CCD, and annular bright field/dark field detectors for STEM imaging.

Location: B18 McNutt Hall

Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service | User- Assistance Form

JXA-iHP200F Field Emission Electron Probe MicroAnalyzer (FE-EPMA): new equipment coming soon

Capabilities/Specifications:

  • Magnification Range 40X to 300,000X (at 11mm WD)
  • Scanning modes: Standard (STD) SEM (high-resolution imaging), EPMA (high beam current mode with auto ACL settings)
  • 39 User-selectable scan speeds/photo speeds (Pixel resolution dependent)
  • Defocused probe up to 300 μm diameter in 0.1μm increments
  • HT wobbler

Location: TBD

Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service | User-Assistance Form

General Inquiries

If you have a question about our equipment capabilities or want to know more about what’s available, let us know!

Senior Research Specialists

Dr. Clarissa Wisner
cvierret@mst.edu

SEM (Raith eline and PrismaE)

Phone: (573) 341-4393
B20A McNutt Hall

Dr. Ahmed Darwish
adarwish@mst.edu

TEM/EPMA (Tecnai F20 and JXA-iHP200F)

Phone: (573) 341-6467
B20A McNutt Hall

Dr. Hien Truong
htrdd@mst.edu

FIB/SEM (Hydra and Nanolab 600)

Phone: (573) 341-4873
B20A McNutt Hall